The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Nov. 13, 2018
Applicant:

Laser Institute of Shandong Academy of Sciences, Ji'ning, Shandong, CN;

Inventors:

Ying Shang, Shandong, CN;

Chen Wang, Shandong, CN;

Chang Wang, Shandong, CN;

Jiasheng Ni, Shandong, CN;

Chang Li, Shandong, CN;

Bing Cao, Shandong, CN;

Wen'an Zhao, Shandong, CN;

Sheng Huang, Shandong, CN;

Yang Liu, Shandong, CN;

Xiaohui Liu, Shandong, CN;

Yingying Wang, Shandong, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/331 (2013.01); G01B 9/02041 (2013.01); G01B 9/02056 (2013.01);
Abstract

An optical fiber distributed monitoring system and method is provided. The system includes a laser device, an acousto-optic modulator, a phase matching interferometer, a photoelectric detector and a phase demodulation module. After entering the phase matching interferometer, the Rayleigh backscattering light containing parameter information output from the sensing optical fiber enters the two arms of the phase matching interferometer respectively, and the light of the two arms of the phase matching interferometer is phase-modulated by the first modulation wave and the second modulation wave, respectively and then interfere with each other to generate interference light. The photoelectric detector converts a light signal into an electric signal, and the phase demodulation module processes the electric signal based on the Hilbert algorithm to obtain the parameter change of the environment under test.


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