The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Sep. 21, 2016
Institut Francais Des Sciences ET Technologies Des Transports, DE L'amenagement ET Des Reseaux, Champs sur Marne, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Aghiad Khadour, Draveil, FR;
Jean-Louis Oudar, Chatenay Malabry, FR;
INSTITUT FRANCAIS DES SCIENCES ET TECHNOLOGIES DES TRANSPORTS, DE L'AMENAGEMENT ET DES RESEAUX, Champs sur Marne, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
Abstract
A measurement system for performing measurement by Brillouin scattering analysis, the system comprising a laser emitter device () configured to emit an incident wave (ν) and a reference wave (ν−νB), the incident wave presenting an incident frequency (ν) and the reference wave presenting a reference frequency (ν−νB), the reference frequency (ν−νB) being shifted from the incident frequency (ν) by a predetermined value (νB). The system is configured to: Advantageously, the incident wave and the reference wave come from a dual-frequency vertical-cavity surface-emitting laser source () forming part of the laser emitter device.