The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Oct. 16, 2018
Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Takashi Shimizu, Hikone, JP;

Assignee:

OMRON Corporation, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G06F 17/12 (2006.01); G01B 11/14 (2006.01); G01B 11/00 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 11/002 (2013.01); G01B 11/14 (2013.01); G06F 17/12 (2013.01); G06T 7/521 (2017.01);
Abstract

An image processing system comprises: a projector for projecting pattern light whose coordinate component at least in one direction is determinable; an imaging apparatus for imaging an object illuminated with the pattern light to acquire a pattern image; and a controller including a calculator for calculating the 3D coordinates of a point on the object based on the pattern light and the pattern image. The calculator determines a first point on the pattern image; calculates a second point corresponding to the first point in a pattern-light projection plane; calculates a third point based on the second point in the projection plane, a nonlinear line in the projection plane calculated by analyzing the pattern image, and an epipolar line in the projection plane calculated based on the first point; and calculates the three-dimensional coordinates of the point on the object based on the first point and the third point.


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