The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Mar. 07, 2019
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Kevin W. Peters, Merrimack, NH (US);
Chapin T. Johnson, Nashua, NH (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
Methodology for calibrating a rotating mirror system includes: measuring a normal of a first fiducial of the mirror system; measuring vectors to a second fiducial of the mirror system, each vector being measured at a different angle of rotation about an azimuth axis of rotation of the mirror system; calculating the azimuth axis of rotation using the measured vectors; creating a base coordinate system from the measured first fiducial normal and the calculated azimuth axis of rotation; and for each of a first mirror and a second mirror of the mirror system, measuring normals of the mirror at multiple angles of rotation, calculating an axis of rotation of the mirror using the measured normals, creating a mirror coordinate system from the measured normals and the calculated axis of rotation of the mirror, and calculating a translation and rotation matrix from the mirror coordinate system to the base coordinate system.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile