The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
May. 23, 2016
Apworks Gmbh, Taufkirchen, DE;
Franz Engel, München, DE;
Andreas Nick, München, DE;
Wolfgang Rehm, Hergensweiler, DE;
Christian Weimer, München, DE;
APWORKS GmbH, , DE;
Abstract
A device for the layer-wise additive production of a complex three-dimensional component has a measuring mechanism for continuously monitoring quality indicators during the production of the component, wherein the measuring mechanism and a bed with a material powder are surrounded, at least in regions, by a processing cell filled with a protective gas atmosphere and the material powder of an uppermost layer can be melted in a locally limited manner in a melting zone by means of at least one laser. The measuring mechanism has the at least one laser and at least one optical sensor for the priority detection of the quality indicators in the region of the melting zone, in particular by means of Raman spectroscopy. Consequently, any construction errors in the component can be recognised, evaluated and, if necessary, corrected in a resource-saving manner without delay.