The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Feb. 23, 2017
Applicant:

Cataler Corporation, Kakegawa-shi, Shizuoka, JP;

Inventors:

Takara Misumi, Kakegawa, JP;

Satoshi Matsueda, Kakegawa, JP;

Assignee:

CATALER CORPORATION, Kakegawa-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01J 23/63 (2006.01); B01D 53/94 (2006.01); B01J 37/02 (2006.01); F01N 3/10 (2006.01); B01J 35/00 (2006.01); B01J 35/02 (2006.01);
U.S. Cl.
CPC ...
B01J 23/63 (2013.01); B01D 53/94 (2013.01); B01J 35/0006 (2013.01); B01J 35/023 (2013.01); B01J 37/02 (2013.01); B01J 37/0244 (2013.01); F01N 3/10 (2013.01); F01N 3/101 (2013.01);
Abstract

An exhaust-gas purifying catalyst includes a lower layer containing ceria-based oxide particles and an upper layer containing metal oxide particles and a precious metal supported on the metal oxide particles, wherein the exhaust-gas purifying catalyst is characterized in that the Rh content of the lower layer is equal to or less than 0.25 g/L, and also that the particle-size distribution of the ceria-based oxide particles in the lower layer, which is obtained by scanning electron microscopy, has a first peak in which the peak top thereof is in a region of 0.90-6.50 μm and a second peak in which the peak top thereof is in a region of 9.50-34.0 μm.


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