The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Aug. 18, 2016
Applicant:

Centrillion Technology Holdings Corporation, Grand Cayman, KY;

Inventors:

Wei Zhou, Saratoga, CA (US);

Glenn McGall, Palo Alto, CA (US);

Vijay Singh, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H 21/00 (2006.01); B01J 19/00 (2006.01); C40B 80/00 (2006.01); C12Q 1/68 (2018.01);
U.S. Cl.
CPC ...
B01J 19/0046 (2013.01); C40B 80/00 (2013.01); B01J 2219/00596 (2013.01); B01J 2219/00608 (2013.01); B01J 2219/00612 (2013.01); B01J 2219/00626 (2013.01); B01J 2219/00637 (2013.01); B01J 2219/00641 (2013.01); B01J 2219/00675 (2013.01); B01J 2219/00711 (2013.01); B01J 2219/00722 (2013.01); C12Q 1/68 (2013.01);
Abstract

The present disclosure relates to processes for inverting oligonucleotide probes in an in situ synthesized array. These processes can be used to reverse the orientation of probes with respect to the substrate from 3'-bound to 5′-bound. These processes can also be used to reduce or eliminate the presence of truncated probe sequences from an in situ synthesized array.


Find Patent Forward Citations

Loading…