The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10695706 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 30, 2020

Filed:

Jun. 06, 2018
Applicant:

Center for Integrated Smart Sensors Foundation, Daejeon, KR;

Inventors:

Hyun Tae Cho, Daejeon, KR;

Chong Min Kyung, Daejeon, KR;

Han Jung Kim, Daejeon, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01D 46/46 (2006.01); G01N 21/94 (2006.01); B01D 46/00 (2006.01); G01N 15/06 (2006.01); B01D 46/44 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
B01D 46/0086 (2013.01); B01D 46/0068 (2013.01); B01D 46/442 (2013.01); B01D 46/46 (2013.01); G01N 15/0618 (2013.01); B01D 2279/35 (2013.01); G01N 2015/0046 (2013.01);
Abstract

An apparatus for measuring fine particulate matter to determine a time to replace each of a filter and an air quality sensor based on a concentration of a filtered fine particulate matter and a method thereof are provided. The apparatus for measuring fine particulate matter is applied to an air cleaner, a personal environment monitoring system (PEMS), a fine particulate matter module, or the like by sensing a target material, such as harmful gas, as well as particulate matter and fine particulate matter in the air and providing result information.


Find Patent Forward Citations

Cho, Hyun. (2020). Method and apparatus for measuring fine particulate matters (U.S. Patent No. 10695706). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10695706

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