The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Apr. 04, 2019
The Climate Corporation, San Francisco, CA (US);
Ying Xu, Boston, MA (US);
Erik Andrejko, Oakland, CA (US);
THE CLIMATE CORPORATION, San Francisco, CA (US);
Abstract
A method for generating digital models of potential crop yield based on planting date, relative maturity, and actual production history is provided. In an embodiment, data representing historical planting dates, relative maturity values, and crop yield is received by an agricultural intelligence computer system. Based on the historical data, the system generates spatial and temporal maps of planting dates, relative maturity, and actual production history. Using the maps, the system creates a model of potential yield that is dependent on planting date and relative maturity. The system may then receive actual production history data for a particular field. Using the received actual production history data, a particular planting date, and a particular relative maturity value, the agricultural intelligence computer system computes a potential yield for a particular field.