The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Jul. 14, 2018
Northwestern University, Evanston, IL (US);
William Marsh Rice University, Houston, TX (US);
Oliver Strider Cossairt, Evanston, IL (US);
Jason Holloway, Houston, TX (US);
Ashok Veeraraghavan, Houston, TX (US);
Manoj Kumar Sharma, Houston, TX (US);
Yicheng Wu, Houston, TX (US);
Northwestern University, Evanston, IL (US);
William Marsh Rice University, Houston, TX (US);
Abstract
A method for imaging objects includes illuminating an object with a light source of an imaging device, and receiving an illumination field reflected by the object. An aperture field that intercepts a pupil of the imaging device is an optical propagation of the illumination field at an aperture plane. The method includes receiving a portion of the aperture field onto a camera sensor, and receiving a sensor field of optical intensity. The method also includes iteratively centering the camera focus along the Fourier plane at different locations to produce a series of sensor fields and stitching together the sensor fields in the Fourier domain to generate an image. The method also includes determining a plurality of phase information for each sensor field in the series of sensor fields, applying the plurality of phase information to the image, receiving a plurality of illumination fields reflected by the object, and denoising the intensity of plurality of illumination fields using Fourier ptychography.