The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Jun. 18, 2018
Applicants:
Ehud Nir, Ottawa, CA;
Henry Wong, Ottawa, CA;
Petar Ivanov Krotnev, Ottawa, CA;
Inventors:
Assignee:
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 1/0042 (2013.01); H04L 1/0045 (2013.01); H04L 1/0058 (2013.01); H04L 1/0072 (2013.01); H04L 43/087 (2013.01);
Abstract
Devices and methods are provided for performing a high-frequency jitter self stress check on a receiver to assist with optimization. High-frequency jitter is injected into a clock signal recovered from a received data signal and used to sample the data signal. The injected jitter increases the bit error rate (BER), making BER a more useful and quicker optimization metric in applications using low-noise communication links. Error correction is used to maintain acceptable output BER while the self stress check is in progress.