The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Oct. 17, 2018
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Chad Patterson, Marina Del Rey, CA (US);

Duke Quach, San Gabriel, CA (US);

Ethan S. Heinrich, San Pedro, CA (US);

Michael M. Fitzgibbon, Playa Del Rey, CA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 31/06 (2006.01); H01R 13/6473 (2011.01); H01R 12/75 (2011.01); H01R 12/71 (2011.01); H01R 12/91 (2011.01); H01R 13/24 (2006.01); H01R 24/44 (2011.01); H01R 24/86 (2011.01); G01R 1/073 (2006.01); H01R 13/405 (2006.01);
U.S. Cl.
CPC ...
H01R 31/06 (2013.01); H01R 12/714 (2013.01); H01R 12/75 (2013.01); H01R 12/91 (2013.01); H01R 13/2421 (2013.01); H01R 13/6473 (2013.01); H01R 24/44 (2013.01); H01R 24/86 (2013.01); G01R 1/07328 (2013.01); H01R 13/2478 (2013.01); H01R 13/405 (2013.01);
Abstract

A coaxial electrical interconnect is disclosed. The coaxial electrical interconnect can include an inner conductor including an electrically conductive spring probe. The coaxial electrical interconnect can also include an outer conductor including a plurality of electrically conductive spring probes disposed about the inner conductor. Each spring probe can have a barrel and a plunger biased out of the barrel. The plunger can have a first plunger portion external to the barrel and a second plunger portion disposed partially in the barrel. The first and second plunger portions can have different diameters. A barrel of the spring probe of the inner conductor can be located proximate a plunger of at least one of the spring probes of the outer conductor.


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