The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Dec. 18, 2018
Applicant:

Lg Display Co., Ltd., Seoul, KR;

Inventors:

Beom-Jin Kim, Seoul, KR;

Sunkyung Shin, Gyeonggi-do, KR;

Bongchoon Kwak, Seoul, KR;

Sojung Jung, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/038 (2013.01); G09G 3/00 (2006.01); G09G 3/3275 (2016.01); G09G 3/3266 (2016.01); G09G 3/3233 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 3/3233 (2013.01); G09G 3/3266 (2013.01); G09G 3/3275 (2013.01); G09G 2300/0842 (2013.01); G09G 2310/0251 (2013.01);
Abstract

The embodiments of the present disclosure relate to a display device, a test circuit, and a test method thereof. More specifically, a display device may include a silicon substrate having a plurality of gate lines, a plurality of data lines, a plurality of sensing lines, and a pixel array on which a plurality of subpixels are arranged; a test circuit arranged on the silicon substrate, the test circuit configured to select at least one line of the plurality of data lines or the plurality of sensing lines, to convert a signal transmitted through the selected line into a digital signal, and to output test data; and a test pad unit configured to output the test data to a circuit outside the silicon substrate.


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