The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Feb. 08, 2019
Adaptix Ltd., Oxfordshire, GB;
Raphael Hauser, Oxford, GB;
Maria Klodt, Oxford, GB;
Gil Travish, Oxford, GB;
Paul Betteridge, Witney, GB;
Adaptix Ltd., Harwell, GB;
Abstract
An x-ray imaging system and method for reconstructing three-dimensional images of a region of interest from spatially and temporally overlapping x-rays using novel reconstruction techniques are provided. The x-ray imaging system may include a detector to generate a signal in response to x-rays incident upon the detector, wherein the signal indicates the intensity of the x-rays incident upon a pixel of the detector, a plurality of x-ray sources arranged to emit x-rays such that said x-rays pass through a region of interest (ROI) and spatially and temporally overlap at the pixel of the detector, and a processing unit to receive the signal indicating the intensity of x-rays incident upon the pixel of the detector and generate an estimate of the intensity attributable to each of the two or more x-rays overlapping at the pixel of the detector.