The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Aug. 01, 2016
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Jeffrey G. Thompson, Auburn, WA (US);

Morteza Safai, Newcastle, WA (US);

Assignee:

THE BOEING COMPANY, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01J 5/08 (2006.01); G01N 25/72 (2006.01); G06K 9/62 (2006.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01); H04N 5/33 (2006.01); B29C 70/38 (2006.01); B29C 70/54 (2006.01); G06T 7/70 (2017.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); B29C 70/38 (2013.01); B29C 70/54 (2013.01); G01J 5/0896 (2013.01); G01N 25/72 (2013.01); G06K 9/6267 (2013.01); G06T 7/70 (2017.01); H04N 5/2252 (2013.01); H04N 5/23293 (2013.01); H04N 5/33 (2013.01); G01J 2005/0077 (2013.01);
Abstract

A system and method for the detection of foreign object debris materials or defects on and/or under a surface of a composite part under manufacture. A member, for example an inspection gantry, is configured to move over the surface. A thermal excitation source is fixed to the member and is configured to direct infrared radiation across the surface. An infrared camera is also fixed to the member a predetermined distance away from the thermal excitation source and is configured to scan the surface as the member moves over the surface to detect and output scan information of the surface. A controller is coupled to the excitation source and to the infrared camera. The controller is configured to process the scan information from the infrared camera to identify a foreign object debris material or defect located on and/or under the surface.


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