The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Jul. 06, 2018
Optum Services (Ireland) Limited, Dublin, IE;
Elizabeth Mae Obee, New Orleans, LA (US);
Sheila Greene, Dublin, IE;
Marcus Alan Ballard, Pelham, AL (US);
Jacques Bellec, Dublin, IE;
Optum Services (Ireland) Limited, Dublin, IE;
Abstract
Machine-learning concepts for detecting and visualizing healthcare fraud, waste, and abuse risk using a data driven decision and investigations support system. The concepts comprise an analytic core that processes a large amount of data, generates an overall risk score, and ranks healthcare providers and/or members. The overall risk score is an integrated score encompassing multiple categories of risk. The multiple categories of risk factors include multiple definitions of what defines risk, allowing for a synergistic effect between the risk analytics, where the overall effect of the combination is greater than the sum of the effects of any one definition of risky behavior by a provider or member. Utilizing this approach a unique risk profile of healthcare providers and members is generated and visualized to the user. Various embodiments further encompass a user interface that comprises linked panels that display targeted information regarding providers and members.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile