The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Mar. 27, 2018
Applicant:

Secure-ic Sas, Cesson-Sévigné, FR;

Inventors:

Sylvain Guilley, Paris, FR;

Théophile Boue, Servon sur Vilaine, FR;

Assignee:

SECURE-IC SAS, Cesson-Sévigné, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 30/3323 (2020.01); G01R 31/3185 (2006.01); G01R 31/3183 (2006.01); G01R 31/317 (2006.01); G06F 30/39 (2020.01); G06F 30/327 (2020.01); G06F 111/04 (2020.01); G06F 111/20 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3323 (2020.01); G01R 31/3185 (2013.01); G01R 31/31719 (2013.01); G01R 31/318314 (2013.01); G01R 31/318588 (2013.01); G06F 30/327 (2020.01); G06F 30/39 (2020.01); G06F 2111/04 (2020.01); G06F 2111/20 (2020.01);
Abstract

Devices, methods, and computer program products for detecting Points Of Failures in an integrated circuit (IC) are provided. The integrated circuit device is described by a structural description () comprising a plurality of elements, the elements representing cells and wires interconnecting the cells, the structural description further comprising portions representing a set of sensitive functional blocks (), each sensitive functional block comprising one or more inputs, at least one sensitive output, and a set of elements interconnected such that the value of the sensitive output is a Boolean function of the input values of the sensitive functional block. The detection device () comprises: The detection device () is configured to detect that said n-tuple represents a Point Of Failure of order n in the integrated circuit (IC) device if the derivative of the Boolean function associated with said sensitive functional block is equal to zero.


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