The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Oct. 31, 2017
International Business Machines Corporation, Armonk, NY (US);
Brian L. Baggett, Renton, WA (US);
Thomas A. Beavin, Milpitas, CA (US);
Oliver Draese, Los Gatos, CA (US);
Shuanglin Guo, Cupertino, CA (US);
Andrei F. Lurie, San Jose, CA (US);
Terence P. Purcell, Springfield, IL (US);
Shengxi Suo, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and computer program product are provided. A first index scan of records of a database table is performed. A first index used by the first index scan is specified in a DBMS query statement as being ordered by one or more field values of one or more fields of the first index. A second scan of the database table is performed to determine whether each respective record of the second scan is qualified based on one or more fields of the each respective record of the second scan and a predicate. A lookup data structure is built indicating whether each of the respective records of the second scan is qualified. The lookup data structure is used to determine whether a record of the first index scan is qualified when the lookup data structure becomes available.