The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Oct. 19, 2016
Applicant:

Nutanix, Inc., San Jose, CA (US);

Inventors:

Abhinay Nagpal, San Jose, CA (US);

Aditya Ramesh, San Jose, CA (US);

Himanshu Shukla, San Jose, CA (US);

Rahul Singh, Mountain View, CA (US);

Assignee:

Nutanix, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/50 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 9/50 (2013.01); G06N 20/00 (2019.01);
Abstract

Systems for distributed resource system management. A first computing system operates in a first computing environment. A predictive model is trained in the first computing environment to form a trained resource performance predictive model that comprises a set of trained model parameters to capture at least computing and storage IO parameters that are responsive to execution of one or more workloads that consume computing and storage resources in the first computing environment. When the trained resource performance predictive model is deployed to a second computing environment, various computing system configuration differences, and/or workload differences and/or other differences between the first computing environment and the second computing environment are detected and measured. Responsive to the detected differences and/or measurements, some of the trained resource performance predictive model parameters are modified to adapt the trained resource performance predictive model to any of the detected and/or measured characteristics of the second computing environment.


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