The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Apr. 26, 2017
Applicant:
Board of Regents, the University of Texas System, Austin, TX (US);
Inventors:
Chi Yen Kim, El Paso, TX (US);
David Espalin, El Paso, TX (US);
Eric MacDonald, El Paso, TX (US);
Ryan Wicker, El Paso, TX (US);
Assignee:
Board of Regents, The University of Texas System, Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/048 (2006.01); B33Y 50/02 (2015.01); B29C 64/386 (2017.01); B29C 64/118 (2017.01); B29C 64/209 (2017.01); B29C 64/321 (2017.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 19/048 (2013.01); B29C 64/118 (2017.08); B29C 64/209 (2017.08); B29C 64/321 (2017.08); B29C 64/386 (2017.08); B33Y 50/02 (2014.12); G05B 19/0428 (2013.01); G05B 2219/49023 (2013.01);
Abstract
Methods and systems for diagnosing and controlling material deposition during a material extrusion 3D printing process. A current sensor can measure a current signal consumed by a material feed motor. The current signal can be analyzed in the time domain and frequency domain to detect material deposition characteristics and prescribe process parameter changes.