The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Oct. 15, 2018
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Hisao Kitagawa, Tokyo, JP;
Yusuke Yamashita, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Visual observation of morphological features of a cell group or individual cells acquired in 3D image data is facilitated, thus improving observation accuracy. Provided is an image processing device that generates, on the basis of a plurality of 2D images acquired by a microscope at different focus positions on a cell clump, 3D images of respective cells constituting the cell clump, that processes the generated 3D images and analyzes feature amounts on the basis of at least one measurement parameter, that displays analysis results in a graph, that allows a user to select a region of interest on the displayed graph, and that generates, from the 3D images that correspond to the plurality of cells that are included in the selected region of interest, 2D display images each in a plane with reference to an axis that is determined on the basis of a shape feature of the corresponding cell and displays the 2D display images in a list.