The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Dec. 01, 2015
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventors:

Yukito Nakamura, Saitama, JP;

Kosuke Nagae, Tokyo, JP;

Takatoshi Kaya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/553 (2006.01); G01N 21/64 (2006.01); G01J 3/02 (2006.01); G01J 3/18 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 21/648 (2013.01); G01J 3/0202 (2013.01); G01J 3/0224 (2013.01); G01J 3/0237 (2013.01); G01J 3/18 (2013.01); G01N 21/6428 (2013.01); G01N 21/6445 (2013.01); G01N 33/54373 (2013.01); G01N 33/553 (2013.01); G01N 2021/6439 (2013.01); G01N 2021/6463 (2013.01); G01N 2201/0683 (2013.01);
Abstract

The surface plasmon-enhanced fluorescence measurement device has: a light source that irradiates the diffraction grating with a linearly polarized excitation light; a rotating part that changes the direction of the optical axis of the excitation light with respect to the diffraction grating when seen in plan view, or changes the polarization direction of the excitation light with respect to the diffraction grating; a polarizer that extracts linearly polarized light from the fluorescence emitted from the fluorescent substance; and a light detection unit that detects the linearly polarized light extracted by the polarizer.


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