The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Sep. 24, 2018
Applicant:

Topcon Corporation, Itabashi-ku, Tokyo, JP;

Inventors:

Daisuke Sasaki, Tokyo, JP;

Koji Onishi, Tokyo, JP;

Masaki Takanashi, Tokyo, JP;

Kiyoyasu Takahashi, Tokyo, JP;

Shugo Akiyama, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Itabashi-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/10 (2006.01); G06T 15/00 (2011.01); A61B 5/107 (2006.01);
U.S. Cl.
CPC ...
G01C 15/10 (2013.01); G06T 15/005 (2013.01); A61B 5/107 (2013.01); G06T 2207/10028 (2013.01);
Abstract

An analysis system for analyzing inclination of column members includes a laser scanner, a server, and an information terminal. The server includes a data acquisition unit configured to acquire three-dimensional point cloud data of the column members generated by the laser scanner, a surface detector configured to detect surfaces of the column members based on the three-dimensional point cloud data, and an inclination analyzer configured to analyze inclination of the column members by calculating inclination of the surfaces detected by the surface detector.


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