The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Dec. 23, 2016
Applicant:

Xuanzhu Pharma Co., Ltd., Jinan, Shandong Province, CN;

Inventors:

Chutian Shu, Jinan, CN;

Jinyuan Wang, Jinan, CN;

Zhenhua Wang, Jinan, CN;

Yuzhen Feng, Jinan, CN;

Assignee:

Xuanzhu Pharma Co., Ltd., Jinan, Shandong Province, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07D 401/12 (2006.01); A61K 31/517 (2006.01); A61K 31/519 (2006.01); A61P 11/00 (2006.01); A61P 17/00 (2006.01); A61P 13/08 (2006.01); A61P 35/00 (2006.01);
U.S. Cl.
CPC ...
C07D 401/12 (2013.01); A61K 31/517 (2013.01); A61K 31/519 (2013.01); A61P 11/00 (2018.01); A61P 13/08 (2018.01); A61P 17/00 (2018.01); A61P 35/00 (2018.01); C07B 2200/13 (2013.01);
Abstract

The invention relates to Crystal form I, Crystal form II and Crystal form III of N-(4-((3-chloro-4-fluorophenyl)amino)-7-((7-methyl-7-azaspiro[3.5]nonan-2-yl)methoxy)quinazolin-6-yl)acrylamide represented by the following Formula (I), and preparation methods thereof, wherein the Crystal form I has an X-ray powder diffraction pattern having characteristic peaks at the 2θ positions of 6.7±0.2°, 7.9±0.2°, 8.6±0.2°, 12.0±0.2°, 13.9±0.2°, 15.9±0.2°, 17.3±0.2°, 18.3±0.2°, 18.7±0.2°, 21.0±0.2°, and 23.0±0.2°, as determined by using Cu-Kα radiation; the Crystal form II has an X-ray powder diffraction pattern having characteristic peaks at the 2θ positions of 6.9±0.2°, 8.5±0.2°, 14.8±0.2°, 15.6±0.2°, 16.7±0.2°, 17.1±0.2°, 17.9±0.2°, 18.7±0.2°, 19.1±0.2°, 21.5±0.2°, 23.5±0.2°, and 25.7±0.2°, as determined by using Cu-Kα radiation; and the Crystal form III has an X-ray powder diffraction pattern having characteristic peaks at the 2θ positions of 4.9±0.2°, 6.1±0.2°, 7.4±0.2°, 11.4±0.2°, 12.2±0.2°, 16.6±0.2°, and 18.4±0.2°, as determined by using Cu-Kα radiation.


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