The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Sep. 07, 2018
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Kazuhiro Itsumi, Koto, JP;

Yasuharu Hosono, Kawasaki, JP;

Tomio Ono, Yokohama, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/12 (2006.01); G01N 29/04 (2006.01); G01N 29/34 (2006.01);
U.S. Cl.
CPC ...
B65H 7/12 (2013.01); G01N 29/041 (2013.01); G01N 29/348 (2013.01); B65H 2553/30 (2013.01); B65H 2701/1912 (2013.01);
Abstract

According to one embodiment, an inspection device includes a transmitter, a receiver, a feeder, and a processor. The transmitter emits an ultrasonic wave. The feeder causes an inspection object to move relative to the transmitter and the receiver in a space between the transmitter and the receiver. The processor processes a received signal corresponding to the ultrasonic wave obtained by the receiver. In a first state in which the inspection object includes a first region and a second region, the first region includes a foreign object, and the second region does not include the foreign object. The received signal includes a first signal level in a first interval, a second signal level in a second interval, and a third signal level in a third interval. The processor detects the foreign object by detecting at least one extreme value occurring in the received signal in a fourth interval.


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