The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Sep. 15, 2017
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Makoto Kitamura, Hachioji, JP;

Toshiya Kamiyama, Hachioji, JP;

Mitsutaka Kimura, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 90/00 (2016.01); A61B 1/045 (2006.01); A61B 1/00 (2006.01); A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
A61B 90/361 (2016.02); A61B 1/00009 (2013.01); A61B 1/045 (2013.01); A61B 1/041 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/30096 (2013.01);
Abstract

An image processing device includes: an abnormality candidate region detection unit configured to detect, from an intraluminal image obtained by imaging a living body lumen, an abnormality candidate region in which a tissue characteristic of the living body or an in-vivo state satisfies a predetermined condition; a feature data calculation unit configured to calculate, from each of a plurality of regions inside the intraluminal image, a plurality of pieces of feature data including different kinds; an integrated feature data calculation unit configured to calculate integrated feature data by integrating the plurality of pieces of feature data based on information of the abnormality candidate region; and a detection unit configured to detect an abnormality from the intraluminal image by using the integrated feature data.


Find Patent Forward Citations

Loading…