The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2020
Filed:
Aug. 02, 2016
National University Corporation Ehime University, Matsuyama-shi, Ehime, JP;
Minoru Kawahara, Matsuyama, JP;
Nobuyuki Takahashi, Matsuyama, JP;
NATIONAL UNIVERSITY CORPORATION EHIME UNIVERSITY, Matsuyama-shi, Ehime, JP;
Abstract
A method for measuring visual field comprising a reference standardized symbol display operation in which a standardized test symbol is displayed at a reference location BP provided at a center of a display; a reference input operation in which a test subject is made to input the fact that the standardized test symbol displayed at the reference standardized symbol display operation has been recognized; a peripheral standardized symbol display operation in which, following input of the fact that the standardized test symbol was recognized at the reference input operation, a standardized test symbol is displayed at a location different from the reference location BP; and a peripheral input operation in which the test subject is made to input the fact that the standardized test symbol displayed at the peripheral standardized symbol display operation has been recognized; wherein a response time is measured from when the standardized test symbol is displayed at the peripheral standardized symbol display operation to when the fact that the standardized test symbol has been recognized is input at the peripheral input operation.