The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Sep. 29, 2014
Microsoft Corporation, Redmond, WA (US);
Trishul Chilimbi, Seattle, WA (US);
Yutaka Suzue, Issaquah, WA (US);
Johnson T. Apacible, Mercer Island, WA (US);
Karthik Kalyanaraman, Redmond, WA (US);
Olatunji Ruwase, Bellevue, WA (US);
Yuxiong He, Bellevue, WA (US);
Feng Yan, Williamsburg, VA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
A performance investigation tool (PIT) is described herein for investigating the performance of a distributed processing system (DPS). The PIT operates by first receiving input information that describes a graph processing task to be executed using a plurality of computing units. The PIT then determines, based on the input information, at least one time-based performance measure that describes the performance of a DPS that is capable of performing the graphical task. More specifically, the PIT can operate in a manual mode to explore the behavior of a specified DPS, or in an automatic mode to find an optimal DPS from within a search space of candidate DPSs. A configuration system may then be used to construct a selected DPS, using the plurality of computing units. In one case, the graph processing task involves training a deep neural network model having a plurality of layers.