The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Sep. 25, 2018
Applicant:
Johnstech International Corporation, Minneapolis, MN (US);
Inventors:
Jeffrey Sherry, Savage, MN (US);
Michael Andres, Inver Grove Heights, MN (US);
Assignee:
JOHNSTECH INTERNATIONAL CORPORATION, Minneapolis, MN (US);
Primary Examiner:
Int. Cl.
CPC ...
H01R 12/70 (2011.01); G01R 31/28 (2006.01); H01R 12/82 (2011.01); G01R 1/04 (2006.01); H01R 13/24 (2006.01);
U.S. Cl.
CPC ...
H01R 12/7076 (2013.01); G01R 1/0466 (2013.01); G01R 31/2886 (2013.01); H01R 12/82 (2013.01); H01R 13/2407 (2013.01); H01R 13/2435 (2013.01); H01R 2201/20 (2013.01);
Abstract
A test socket () for a testing an integrated circuit () with controlled impedance while maintaining the structural integrity of the test pins (). The pin () can have a sidewall with a thick portionand a thinner portion () along the length of the pin. The pin can have projections () which provide a standoff from the slot (). The sidewalls themselves can have projections or lands () which extend into the slot and provide stability for the pin ().