The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Dec. 26, 2017
Applicant:

SK Hynix Inc., Icheon, KR;

Inventors:

Sang-Hyun Ban, Icheon, KR;

Tae-Hoon Kim, Seongnam, KR;

Woo-Tae Lee, Seoul, KR;

Hye-Jung Choi, Icheon, KR;

Assignee:

SK hynix Inc., Icheon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/50 (2006.01); G06F 1/24 (2006.01); G11C 29/46 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50004 (2013.01); G06F 1/24 (2013.01); G11C 29/12005 (2013.01); G11C 29/46 (2013.01); G11C 29/50008 (2013.01); G11C 29/883 (2013.01); G11C 2029/5004 (2013.01);
Abstract

Provided is an electronic device including a semiconductor memory. The semiconductor memory may include: a plurality of first lines; a plurality of second lines; a plurality of memory cells disposed in respective intersection regions between the plurality of first lines and the plurality of second lines; a first test circuit configured to apply a stress pulse to a first selection line coupled to a defective memory cell among the plurality of memory cells during a first test period, in response to a first test control signal, the first selection line including any one of the plurality of first lines; and a control unit configured to generate the first test control signal based on a first test mode signal.


Find Patent Forward Citations

Loading…