The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Feb. 28, 2018
Applicant:

Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;

Inventor:

Natsuko Kawai, Hachioji, JP;

Assignee:

KONICA MINOLTA, INC., Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06K 9/48 (2006.01); G06K 9/03 (2006.01); G06T 7/00 (2017.01); G06T 7/168 (2017.01); G06K 15/02 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06K 9/03 (2013.01); G06K 9/48 (2013.01); G06K 15/027 (2013.01); G06T 7/0002 (2013.01); G06T 7/0004 (2013.01); G06T 7/168 (2017.01); G06K 15/00 (2013.01); G06K 2009/485 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/30144 (2013.01);
Abstract

A system for predicting occurrence of a defective image includes an observation distance obtainer which obtains an observation distance of an image to be formed by an image forming apparatus. The system (i) divides image data input to the image forming apparatus as an original of the image into regions of interest having a size determined based on the observation distance, (ii) analyzes a spatial frequency of a gradient distribution of the image with respect to each of the regions of interest, and (iii) calculates a probability of a target density irregularity being conspicuous in the image to be formed by the image forming apparatus based on the image data by using a correlation index between a result of the analysis and an evaluation value of the density irregularity.


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