The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Jun. 25, 2018
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Fitsum Aklilu Reda, West Chester, PA (US);

Yiqiang Zhan, West Chester, PA (US);

Parmeet Singh Bhatia, Frazer, PA (US);

Yoshihisa Shinagawa, Downingtown, PA (US);

Luca Bogoni, Philadelphia, PA (US);

Xiang Sean Zhou, Exton, PA (US);

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G01B 21/20 (2006.01); G06T 7/12 (2017.01); G06T 7/60 (2017.01); G06T 7/66 (2017.01); G06N 20/00 (2019.01); G06K 9/62 (2006.01); G06T 7/62 (2017.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G01B 21/20 (2013.01); G06K 9/4628 (2013.01); G06K 9/627 (2013.01); G06N 20/00 (2019.01); G06T 7/12 (2017.01); G06T 7/60 (2013.01); G06T 7/62 (2017.01); G06T 7/66 (2017.01); G06K 2209/051 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30048 (2013.01); G06T 2207/30101 (2013.01); G06T 2207/30172 (2013.01);
Abstract

A framework for automated measurement. In accordance with one aspect, the framework detects a centerline point of a structure of interest in an image. A centerline of the structure of interest may be traced based on the detected centerline point. A trained segmentation learning structure may be used to generate one or more contours of the structure of interest along the centerline. One or more measurements may then be extracted from the one or more contours.


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