The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Sep. 08, 2017
Applicant:

Sz Dji Technology Co., Ltd., Shenzhen, CN;

Inventors:

Zisheng Cao, Shenzhen, CN;

Zhanli Zhang, Shenzhen, CN;

Junjie Chen, Shenzhen, CN;

Mingyu Wang, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); H04N 5/232 (2006.01); G06T 7/32 (2017.01); H04N 5/262 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G06T 7/32 (2017.01); H04N 5/23238 (2013.01); H04N 5/2624 (2013.01); G06T 2200/32 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/20221 (2013.01);
Abstract

An imaging system for adaptively generating panoramic images and methods for manufacturing and using same are provided. The system includes an imaging device configured to capture digital images at a plurality of image capture positions. The system further includes a processor configured to identify an overlapping portion of first and second images captured at respective first and second image capture positions, determine a stitching position quality measure for a plurality of stitching positions in the overlapping portion of the first and second images, and select a stitching position based on the determined stitching position quality measures of the plurality of stitching positions of the first and second images. The processor is also configured to stitch the first and second images together at the selected stitching position to generate a panoramic image and determine a third image capture position based on the stitching position quality measure.


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