The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Feb. 27, 2014
Here Global B.v., Veldhoven, NL;
Timur Perelmutov, Naperville, IL (US);
Robert Camp, Winfield, IL (US);
Toby Tennent, Chicago, IL (US);
Gavril Giurgiu, Chicago, IL (US);
Mark Pundurs, Des Plaines, IL (US);
Justin Spelbrink, Sunnyvale, CA (US);
Leon Stenneth, Chicago, IL (US);
Dereje Befecadu, Chicago, IL (US);
HERE Global B.V., Veldhoven, NL;
Abstract
An approach is provided for determining at least one distribution of a plurality of current values for at least one dynamic content parameter associated with a plurality of points of interest within a predetermined proximity to at least one target point of interest. The approach involves determining at least one distribution mean and at least one distribution standard deviation for the at least one distribution of the plurality of current values. The approach also involves determining at least one set of historical values for the at least one dynamic content parameter for the at least one target point of interest. The approach further involves determining at least one estimated current value for the at least one dynamic content parameter associated with the at least one target point of interest based, at least in part, on the at least one set of historical values, the at least one distribution mean, and the at least one distribution standard deviation.