The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Apr. 03, 2017
Applicant:

Hirevue, Inc., South Jordan, UT (US);

Inventors:

Benjamin Taylor, Lindon, UT (US);

Loren Larsen, Lindon, UT (US);

Assignee:

HireVue, Inc., South Jordan, UT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/10 (2012.01); G06K 9/00 (2006.01); G06Q 10/06 (2012.01); G09B 7/02 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/1053 (2013.01); G06K 9/00295 (2013.01); G06K 9/00422 (2013.01); G06K 9/00677 (2013.01); G06Q 10/063112 (2013.01); G06Q 10/063114 (2013.01); G09B 7/02 (2013.01);
Abstract

A method for detecting bias in an evaluation process is provided. The method includes operations of receiving evaluation data from a candidate evaluation system. The evaluation data is provided by a set of evaluators based on digital interview data collected from evaluation candidates. The operations of the method further include extracting indicators of characteristics of the evaluation candidates from the digital interview data, classifying the evaluation candidates based on the indicators extracted from the digital interview data, and determining whether the evaluation data indicates a bias of one or more evaluators with respect to a classification of the evaluation candidates.


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