The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Jan. 12, 2018
Sentera, Inc., Minneapolis, MN (US);
Andrew Muehlfeld, Minneapolis, MN (US);
Justin Hui, Minneapolis, MN (US);
Reid Plumbo, Minneapolis, MN (US);
Joe Tinguely, Minneapolis, MN (US);
Sentera, Inc., Minneapolis, MN (US);
Abstract
Index-based geospatial analysis may include applying a first and second index-based analysis for a set of imagery. The set of imagery may include a location-specific index values used to form a histogram for a single index image (e.g., for a single surveyed field). This first analysis may be referred to as an 'acre-to-acre' mapping, which may be useful for identifying differences in indices (e.g., NDVI vegetative health) of different parts of the field from a single day. A second 'day-to-day' index-based analysis may be performed by calculating a histogram for each set of imagery from multiple days, combining the histograms, and generating a single equal-area index map. The index map can be applied to redistribute the histogram values within multiple days of data, which may provide a more useful map of variation in each individual image and changes between images.