The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Feb. 23, 2018
Applicant:

Wistron Corp., New Taipei, TW;

Inventors:

Yu-Ren Lai, New Taipei, TW;

Po Chun Chen, New Taipei, TW;

Ching-An Cho, New Taipei, TW;

Kuo Ting Huang, New Taipei, TW;

Yu-Yen Chen, New Taipei, TW;

Assignee:

Wistron Corp., New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01); A61B 5/00 (2006.01); A61B 5/11 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00362 (2013.01); A61B 5/0037 (2013.01); A61B 5/1116 (2013.01); A61B 5/4806 (2013.01); A61B 5/7246 (2013.01); G06K 9/3233 (2013.01); A61B 5/1121 (2013.01); A61B 5/4561 (2013.01); G06T 7/0014 (2013.01);
Abstract

An image detection method for determining the posture of a user includes: obtaining a reference image of the user in a region of interest (ROI); obtaining a test image of user at the ROI; executing a feature matching analysis of the test image which compares the feature parameter of the test image and the feature parameter of the reference image to determine the similarity information of the test image and the reference image; and executing a pixel distribution analysis of the test image to obtain user pixel distribution information; and determining the posture of the user based on the user similarity information and the user pixel distribution information.


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