The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Jul. 26, 2016
Applicant:

Mitek Holdings, Inc., Wilmington, DE (US);

Inventors:

William A. Wright, Lexington, MA (US);

Michael G. Shnitman, Newton, MA (US);

Assignee:

MITEK HOLDINGS, INC., Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 30/13 (2020.01); G06F 119/08 (2020.01);
U.S. Cl.
CPC ...
G06F 30/13 (2020.01); G06F 2119/08 (2020.01);
Abstract

Disclosed aspects relate to managing a set of spatial zones associated with an architectural layout. A first spatial zone of the set of spatial zones is detected. The first spatial zone has a first spatial zone size value. By comparing the first spatial zone size value with a threshold spatial zone size value, it is determined to convert the first spatial zone. Based on proximity, a group of conversion candidates is identified from the set of spatial zones. Based on the first spatial zone and the group of conversion candidates, a second spatial zone is determined using an architectural criterion. Using the second spatial zone, a design-model of the architectural layout is established.


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