The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

May. 07, 2019
Applicant:

Idhl Holdings, Inc., Wilmington, DE (US);

Inventor:

Hua Sheng, Bridgewater, NJ (US);

Assignee:

IDHL Holdings, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/16 (2006.01); G01R 33/00 (2006.01); G01R 33/022 (2006.01); G01B 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01); G01B 7/003 (2013.01); G01R 33/0035 (2013.01); G01R 33/022 (2013.01);
Abstract

Methods and apparatuses for calibrating attitude-independent parameters of a 3-D magnetometer are provided. A calibration method includes storing and updating data related to a N×9 matrix T and a N×1 matrix U extended for each measurement with an additional row and an additional element, respectively, the additional row and the additional element being calculated based on values measured by the 3-D magnetometer for the respective measurement. The method further includes calculating analytically (1) a symmetric non-orthogonal 3×3 matrix D representing scaling and skew of the 3-D magnetometer measured values and (2) a vector b representing bias of the 3-D magnetometer measured values, using the stored data and a singular value decomposition (SVD) method.


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