The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Jul. 17, 2017
Darya Y. Orlova, Menlo Park, CA (US);
Stephen W. Meehan, Burnaby, CA;
Wayne A. Moore, San Francisco, CA (US);
Guenther Walther, Mountain View, CA (US);
David R. Parks, San Francisco, CA (US);
Leonore A. Herzenberg, Stanford, CA (US);
Connor Meehan, Burnaby, CA;
Darya Y. Orlova, Menlo Park, CA (US);
Stephen W. Meehan, Burnaby, CA;
Wayne A. Moore, San Francisco, CA (US);
Guenther Walther, Mountain View, CA (US);
David R. Parks, San Francisco, CA (US);
Leonore A. Herzenberg, Stanford, CA (US);
Connor Meehan, Burnaby, CA;
The Board of Trustees of The Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
Some embodiments provide methods, systems and computer-readable media that employ adaptive binning and dissimilarity scores based on a quadratic form distance for multidimensional data for matching clusters in data corresponding to different sample. Some embodiments provide methods, systems and computer-readable media for rendering a first interactive display including a two-dimensional plot of at least a portion of a multidimensional data set and a corresponding second interactive display including a plurality of single parameter charts or histograms, each displaying information corresponding to one-dimensional measurements of a different parameter in the multidimensional data set.