The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Nov. 10, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Anthony T. Brew, Dublin, IE;

John D. Postoyko, Hemel Hempstead, GB;

Jonathan I. Settle, Southampton, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 16/2455 (2019.01); G06F 16/2457 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/2358 (2019.01); G06F 16/24568 (2019.01); G06F 16/24578 (2019.01);
Abstract

A plurality of first event instances of a first event and a plurality of second event instances of a second event are received based on the first event occurring and the second event occurring. Each event instance has an event identifier and a timestamp. A first event type of the plurality of first event instances and a second event type of the plurality of second event instances are identified. A time period of overlap between the first event and the second event are determined by detecting regular intervals between the plurality of first event instances, as compared to each other, and the plurality of second event instances, as compared to each other. A relationship between the first event and the second event are scored based on the time period of overlap. The first event and the second event are grouped based on the scored relationship.


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