The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Aug. 28, 2018
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Peng Fei, Chengdu, CN;

Zhongyi Zhou, Chengdu, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/455 (2018.01); G06K 9/62 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 9/45512 (2013.01); G06K 9/6218 (2013.01); G06K 9/6256 (2013.01); G06K 9/6278 (2013.01); G06N 20/00 (2019.01);
Abstract

A mapping is created between test steps from existing test cases and code snippets from existing automated test scripts. The code snippets are clustered into categories. The test steps are refined to generate training word segments. A new manual test case to automate is received. New test steps from the new manual test case are refined to generate new word segments. Probabilities are calculated for the categories, each probability indicating a likelihood that a new test step belongs in a particular category, and being based on a training word segment associated with the particular category, and a new word segment derived from the new test step. The new test step is mapped to a code snippet from a category having the highest probability. The probability calculation and code snippet mapping is repeated for each other new test step.


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