The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Mar. 11, 2016
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Jaebum Chung, Pasadena, CA (US);

Changhuei Yang, South Pasadena, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0072 (2013.01); G02B 21/008 (2013.01); G02B 27/0025 (2013.01); G02B 21/0076 (2013.01);
Abstract

Aberration-corrected incoherent imaging methods and systems that can acquire a sequence of coherent images and an incoherent image of a specimen, implement an embedded pupil function recovery process in junction with Fourier ptychographic technique to construct an improved resolution image and pupil function of the imaging system using the sequence of coherent images, determine an optical transfer function based on the estimated pupil function, and remove the aberration from the incoherent image using a deconvolution process to generate an aberration-corrected incoherent image.


Find Patent Forward Citations

Loading…