The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Jan. 15, 2018
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Masahito Dohi, Tokyo, JP;

Yoshihiro Shimada, Sagamihara, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G02B 27/09 (2006.01); G02B 15/04 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 15/04 (2013.01); G02B 21/0048 (2013.01); G02B 21/0076 (2013.01); G02B 21/16 (2013.01); G02B 21/367 (2013.01); G02B 27/0911 (2013.01); G02B 27/0966 (2013.01);
Abstract

A microscope apparatusincludes a detection optical systemthat captures light from a sample S and an illumination optical systemthat radiates an illumination light onto the sample S. The illumination optical systemincludes a cylindrical lensthat has a power in a first-axis direction and does not have a power in a second-axis direction that is perpendicular to the first-axis direction, a cylindrical lensthat has a power in the second-axis direction and does not have a power in the first-axis direction, and a scannerthat scans the illumination light in a width direction. The illumination optical systemis configured such that the first-axis direction is the width direction described above, and the cylindrical lensesandare arranged posterior to the scanner


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