The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Oct. 13, 2016
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Yuya Miyazono, Hamburg, DE;

Tatsuo Nakata, Tokyo, JP;

Kenichi Kusaka, Brookline, MA (US);

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 3/14 (2006.01); G02B 21/02 (2006.01); G02B 21/06 (2006.01); G02B 21/16 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 3/14 (2013.01); G02B 21/0044 (2013.01); G02B 21/0048 (2013.01); G02B 21/0076 (2013.01); G02B 21/025 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/245 (2013.01);
Abstract

A microscope includes: a light source, an objective, a varifocal optical system that is arranged on an illumination light path between the objective and the light source, a reflection optical system that deflects an illumination light axis of the illumination light toward an optical axis of the objective, and a rotator that rotates the objective and the reflection optical system around a rotation axis that is orthogonal to the optical axis of the objective.


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