The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Jan. 08, 2019
Siemens Healthcare Gmbh, Erlangen, DE;
Duke University, Durham, NC (US);
Xiaodong Zhong, Lilburn, GA (US);
Marcel Dominik Nickel, Herzogenaurach, DE;
Stephan Kannengiesser, Wuppertal, DE;
Brian Dale, Morrisville, NC (US);
Berthold Kiefer, Erlangen, DE;
Mustafa R. Bashir, Cary, NC (US);
Siemens Healthcare GmbH, Erlangen, DE;
Duke University, Durham, NC (US);
Abstract
A magnetic resonance imaging system and method are provided for improved determination of noise bias effects in calculating fitted parameters for quantitative MRI procedures. The system and method includes selecting a range for the SNR and fitted parameter values, and for each of a plurality of base pairs of these values and for a plurality of b values, adding a random noise term to the real and imaginary components of a plurality of corresponding signal terms, fitting magnitudes of the resulting 'noisy' signals to determine a 'noisy' fitted parameter value, and compare the “noisy” and base fitted parameter values to determine a noise-based error for each pair of base values. The noise-based errors can be used to generate an error map, modify imaging parameters to reduce such errors, or correct fitted parameters directly.