The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Nov. 20, 2017
Applicant:
Anton Paar Gmbh, Graz, AT;
Inventors:
Daniel Koller, Graz, AT;
Alberto Gomez-Casado, Seiersberg-Pirka, AT;
Markus Brandner, Raaba-Grambach, AT;
Assignee:
Anton Paar GmbH, Graz, AT;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/02 (2010.01); G01Q 10/06 (2010.01); G01Q 30/02 (2010.01); G01Q 10/00 (2010.01);
U.S. Cl.
CPC ...
G01Q 20/02 (2013.01); G01Q 10/00 (2013.01); G01Q 10/06 (2013.01); G01Q 30/02 (2013.01);
Abstract
A scanning probe microscope analyses a sample by moving a probe and the sample relative to one another. The scanning probe microscope includes a detection unit for detecting an image of a gap between the sample and the probe in a substantially horizontal side view.