The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Feb. 28, 2017
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Hiroyuki Satake, Tokyo, JP;

Kazushige Nishimura, Tokyo, JP;

Hideki Hasegawa, Tokyo, JP;

Masuyuki Sugiyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G01N 27/62 (2006.01); H01J 49/00 (2006.01); H01J 49/06 (2006.01); H01J 49/16 (2006.01);
U.S. Cl.
CPC ...
G01N 27/624 (2013.01); G01N 27/622 (2013.01); H01J 49/004 (2013.01); H01J 49/068 (2013.01); H01J 49/16 (2013.01);
Abstract

In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.


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