The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Nov. 28, 2016
Horiba, Ltd., Kyoto-shi, Kyoto, JP;
Kazuhiro Miyamura, Kyoto, JP;
Yoko Nakai, Kyoto, JP;
HORIBA, Ltd., Kyoto-shi, Kyoto, JP;
Abstract
A measuring instrument is capable of suppressing a flow path from being clogged due to the precipitation of crystals from an internal solution or a calibration liquid even when kept in a waiting state. The measuring instrument includes a measuring electrode and a reference electrode and on the basis of the potential difference generated therebetween, measures a characteristic value of a sample. In order to accomplish the above object, the measuring instrument is adapted to be able to have two states, i.e., a measurement state of measuring the characteristic value of the sample and a waiting state of not performing measurement, and further include a refilling mechanism that refills the calibration liquid or the internal solution used in the reference electrode. In addition, the refilling mechanism is adapted to continuously or intermittently refill the calibration liquid or the internal solution in the waiting state.