The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

May. 17, 2018
Applicant:

Minebea Mitsumi Inc., Nagano, JP;

Inventors:

Satoshi Sato, Fujisawa, JP;

Masateru Kobayashi, Chigasaki, JP;

Assignee:

MINEBEA MITSUMI INC., Nagano, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 5/00 (2006.01); G01K 7/00 (2006.01); G01K 5/52 (2006.01);
U.S. Cl.
CPC ...
G01K 5/52 (2013.01);
Abstract

There is provided a device for measuring a temperature of a metal object itself without being affected by an ambient temperature. A first invention provides a device for measuring a temperature of a metal object using at least one strain gauge, wherein the at least one strain gauge is attached to the metal object and a linear expansion coefficient of the strain gauge is different from a linear expansion coefficient of the metal object. A second invention provides a device for measuring a temperature of a metal object using two strain gauges, wherein the two strain gauges are attached to the metal object, directions of grids of the two strain gauges coincide with each other, a Wheatstone bridge circuit is formed using the two strain gauges, a linear expansion coefficient of a first strain gauge of the two strain gauges is larger than the linear expansion coefficient of the metal object and the linear expansion coefficient of a second strain gauge of the two strain gauges is smaller than the linear expansion coefficient of the metal object.


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